CSIR Technology Portal
CSIR Technology Portal

 Technology Profile

Title:

Dual Energy X-Ray Image Analysis Technique for Material Discrimination
Value Proposition:

Based on Dual enery X ray technique 
Summary Application:
  • Luggage inspection in airports
  • Identifcation of concealed items
Advantages:
  • Dual energy image fusion
  • Determination of atomic number and density of scanned material items
  • Display of density image
  • High density region alarm (red alert)
  • Hardware security enabled X-ray software
Commercialization Status: Licensed awaiting commercialisation
Tech. Readiness Level:
CSIR-Central Electronics Engineering Research Institute
CSIR-Central Electronics Engineering Research Institute[CSIR-CEERI]
:  director[at]ceeri[dot]res[dot]in
:91-1596-242111
:https://www.ceeri.res.in
Industrial Applications: Computers [Electronics] Software [Computers and Electronic Data Processing]